Invention Grant
- Patent Title: Dynamic model detecting apparatus
- Patent Title (中): 动态模型检测装置
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Application No.: US10976787Application Date: 2004-11-01
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Publication No.: US07660707B2Publication Date: 2010-02-09
- Inventor: Yuko Maruyama , Kenji Yamanishi
- Applicant: Yuko Maruyama , Kenji Yamanishi
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Whitham Curtis Christofferson & Cook, PC
- Priority: JP2003-379273 20031110
- Main IPC: G06F17/00
- IPC: G06F17/00

Abstract:
A model detection apparatus comprises a number of estimate parameter memories for storing mutually different distribution estimate parameters representing occurrences of input data. A number of distribution estimators are respectively associated with the parameter memories for producing distribution estimate parameters from data stored in the associated parameter memories and from a series of input data, and updating the associated parameter memories with the produced parameters. A model series memory stores candidate models corresponding in number to the parameter memories. A model series estimator produces candidate models using the series of input data, the stored distribution estimate parameters and the stored candidate models, and updates the model series memory with the produced candidate models. An optimal model series calculator calculates an optimal series of models from the candidate models stored in the model series memory.
Public/Granted literature
- US20050102122A1 Dynamic model detecting apparatus Public/Granted day:2005-05-12
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