Invention Grant
- Patent Title: Method and apparatus for generating components for pattern-based system design analysis using a characteristics model
- Patent Title (中): 使用特征模型生成基于模式的系统设计分析的组件的方法和装置
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Application No.: US11133717Application Date: 2005-05-20
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Publication No.: US07660802B2Publication Date: 2010-02-09
- Inventor: Syed M. Ali , Yury Kamen , Deepak Alur , John P. Crupi , Daniel B. Malks
- Applicant: Syed M. Ali , Yury Kamen , Deepak Alur , John P. Crupi , Daniel B. Malks
- Applicant Address: US CA Santa Clara
- Assignee: Sun Microsystems, Inc.
- Current Assignee: Sun Microsystems, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Osha • Liang LLP
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/00 ; G06F15/16
Abstract:
A method for analyzing a target system that includes obtaining a characteristics model, generating at least one selected from the group consisting of a schema, characteristics store API, and a characteristics extractor, using the characteristics model, obtaining a plurality of characteristics from the target system using characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics in the characteristics store using the schema, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.
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