Invention Grant
US07660974B2 Method and apparatus for analyzing performance, and computer product
失效
分析性能的方法和装置以及计算机产品
- Patent Title: Method and apparatus for analyzing performance, and computer product
- Patent Title (中): 分析性能的方法和装置以及计算机产品
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Application No.: US11524398Application Date: 2006-09-21
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Publication No.: US07660974B2Publication Date: 2010-02-09
- Inventor: Shigeru Kimura
- Applicant: Shigeru Kimura
- Applicant Address: JP Tokyo
- Assignee: Fujitsu Microelectronics Limited
- Current Assignee: Fujitsu Microelectronics Limited
- Current Assignee Address: JP Tokyo
- Agency: Staas & Halsey LLP
- Priority: JP2006-071335 20060315
- Main IPC: G06F11/32
- IPC: G06F11/32 ; G06F11/30

Abstract:
In a performance analyzing apparatus, a setting unit sets an event of which the performance is desired to be monitored, a detecting unit detects an instruction address at the time of generation of an interrupt signal from a timer, and a calculating unit calculates a variation amount of a counted value by a hardware counter at a detected instruction address. The variation amount is accumulatively retained for each detected instruction address. A specifying unit specifies an instruction address that corresponds to the event, and a display unit displays a graph of the total variation amounts.
Public/Granted literature
- US20070220237A1 Method and apparatus for analyzing performance, and computer product Public/Granted day:2007-09-20
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