Invention Grant
US07661050B2 Method and system for formal verification of partial good self test fencing structures 有权
部分良好自检围栏结构的形式验证方法和系统

Method and system for formal verification of partial good self test fencing structures
Abstract:
The concept of applying fencing logic to Built-In Self Test (BIST) hardware structures for the purpose of segregating defective circuitry and utilizing the remaining good circuitry is a well known practice in the chip design industry. Described herein is a method for verifying that any particular implementation of partial fencing logic actually provides the desired behavior of blocking down-stream impact of all signals from fenced interfaces, and also ensuring that the partial fencing does not inadvertently preclude any common logic from being fully tested.
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