Invention Grant
- Patent Title: Method and system for formal verification of partial good self test fencing structures
- Patent Title (中): 部分良好自检围栏结构的形式验证方法和系统
-
Application No.: US11744392Application Date: 2007-05-04
-
Publication No.: US07661050B2Publication Date: 2010-02-09
- Inventor: Gary Van Huben , Adrian E. Seigler
- Applicant: Gary Van Huben , Adrian E. Seigler
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent John E. Campbell; Graham S. Jones, II
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; G01R31/40

Abstract:
The concept of applying fencing logic to Built-In Self Test (BIST) hardware structures for the purpose of segregating defective circuitry and utilizing the remaining good circuitry is a well known practice in the chip design industry. Described herein is a method for verifying that any particular implementation of partial fencing logic actually provides the desired behavior of blocking down-stream impact of all signals from fenced interfaces, and also ensuring that the partial fencing does not inadvertently preclude any common logic from being fully tested.
Public/Granted literature
- US20080276144A1 Method and System for Formal Verification of Partial Good Self Test Fencing Structures Public/Granted day:2008-11-06
Information query
IPC分类: