Invention Grant
- Patent Title: Probabilistic noise analysis
- Patent Title (中): 概率噪声分析
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Application No.: US12046169Application Date: 2008-03-11
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Publication No.: US07661083B2Publication Date: 2010-02-09
- Inventor: Payman Zarkesh-Ha , Sandeep Bhutani , Weiqing Guo
- Applicant: Payman Zarkesh-Ha , Sandeep Bhutani , Weiqing Guo
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Luedeka, Neely & Graham, P.C.
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method of determining whether voltage from an aggressor net exceeds a voltage threshold on a victim net design in an integrated circuit design. Probabilistic noise from the aggressor net on the victim net is calculated. The probabilistic noise is checked against the voltage threshold, and the victim net design is passed when the probabilistic noise does not exceed the voltage threshold. When the probabilistic noise does exceed the threshold, then an effective noise at a desired mean time to failure is computed, and the effective noise is checked against the voltage threshold. The victim net design is passed when the effective noise does not exceed the voltage threshold, and failed when the effective noise does exceed the threshold.
Public/Granted literature
- US20080163145A1 PROBABILISTIC NOISE ANALYSIS Public/Granted day:2008-07-03
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