Invention Grant
- Patent Title: Method and system for defect investigation of component
- Patent Title (中): 组件缺陷检测方法与系统
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Application No.: US11540649Application Date: 2006-10-02
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Publication No.: US07661314B2Publication Date: 2010-02-16
- Inventor: Hubert Mooshofer
- Applicant: Hubert Mooshofer
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Staas & Halsey LLP
- Priority: DE102005047536 20050930
- Main IPC: G01N29/04
- IPC: G01N29/04

Abstract:
One surface of a component is obliquely ensonified through a liquid or gaseous first medium with a checking sound beam produced by a transmission/reception transducer for defect investigation of the component. A response sound beam, which is reflected back from the surface to the transmission/reception transducer, is received and its delay time in the medium between the transmission/reception transducer and the surface is evaluated. The delay time in the medium determined in this way is taken into account for localization of a defect within the component.
Public/Granted literature
- US20070079645A1 Method and system for defect investigation of component Public/Granted day:2007-04-12
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