Invention Grant
- Patent Title: Apparatus for processing substrate and method of processing the same
- Patent Title (中): 基板处理装置及其处理方法
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Application No.: US11304549Application Date: 2005-12-16
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Publication No.: US07662546B2Publication Date: 2010-02-16
- Inventor: Kenji Kawano , Shinichi Ito , Eishi Shiobara , Daisuke Kawamura , Kei Hayasaki
- Applicant: Kenji Kawano , Shinichi Ito , Eishi Shiobara , Daisuke Kawamura , Kei Hayasaki
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2000-394354 20001226; JP2001-011299 20010119; JP2001-385349 20011219
- Main IPC: H05B3/68
- IPC: H05B3/68

Abstract:
A heating apparatus for a substrate to be processed with a coating film has a chamber with an inner space, a heating plate heating the substrate to be processed in the inner space, and a partition member. The heating plate has a support surface which supports the substrate to be processed within the chamber. The partition member is arranged in the chamber so as to face the support surface. The partition member partitions the inner space into first and second spaces, and has a plurality of pores which allow the first and second spaces to communicate with each other. The support surface of the heating plate is set in the first space. An air stream formation mechanism forming an air stream is arranged in the second space. This mechanism discharges a substance evaporated from the photoresist film.
Public/Granted literature
- US20060102614A1 Apparatus for processing substrate and method of processing the same Public/Granted day:2006-05-18
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