Invention Grant
US07663107B2 Method and apparatus for quantitative analysis using terahertz radiation
有权
使用太赫兹辐射进行定量分析的方法和装置
- Patent Title: Method and apparatus for quantitative analysis using terahertz radiation
- Patent Title (中): 使用太赫兹辐射进行定量分析的方法和装置
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Application No.: US10559107Application Date: 2004-05-24
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Publication No.: US07663107B2Publication Date: 2010-02-16
- Inventor: Philip F. Taday
- Applicant: Philip F. Taday
- Applicant Address: GB Cambridge
- Assignee: TeraView Limited
- Current Assignee: TeraView Limited
- Current Assignee Address: GB Cambridge
- Agency: Dickstein Shapiro LLP
- Priority: GB0312627.3 20030602
- International Application: PCT/GB2004/002225 WO 20040524
- International Announcement: WO2004/106905 WO 20041209
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
A method of quantitatively analysing a sample, the method comprising: irradiating the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz; detecting radiation reflected from and/or transmitted by said sample to obtain a frequency domain waveform of said sample; identifying at least one section of interest of said frequency domain wave-form containing spectral features due to intermolecular or other non-intramolecular excitations; and obtaining a value related to the concentration of a component of the sample from the said section.
Public/Granted literature
- US20060237650A1 Method and apparatus for quantitative analysis using terahertz radiation Public/Granted day:2006-10-26
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