Invention Grant
US07663107B2 Method and apparatus for quantitative analysis using terahertz radiation 有权
使用太赫兹辐射进行定量分析的方法和装置

  • Patent Title: Method and apparatus for quantitative analysis using terahertz radiation
  • Patent Title (中): 使用太赫兹辐射进行定量分析的方法和装置
  • Application No.: US10559107
    Application Date: 2004-05-24
  • Publication No.: US07663107B2
    Publication Date: 2010-02-16
  • Inventor: Philip F. Taday
  • Applicant: Philip F. Taday
  • Applicant Address: GB Cambridge
  • Assignee: TeraView Limited
  • Current Assignee: TeraView Limited
  • Current Assignee Address: GB Cambridge
  • Agency: Dickstein Shapiro LLP
  • Priority: GB0312627.3 20030602
  • International Application: PCT/GB2004/002225 WO 20040524
  • International Announcement: WO2004/106905 WO 20041209
  • Main IPC: G01J5/02
  • IPC: G01J5/02
Method and apparatus for quantitative analysis using terahertz radiation
Abstract:
A method of quantitatively analysing a sample, the method comprising: irradiating the sample with radiation having a plurality of frequencies in the range from 25 GHz to 100 THz; detecting radiation reflected from and/or transmitted by said sample to obtain a frequency domain waveform of said sample; identifying at least one section of interest of said frequency domain wave-form containing spectral features due to intermolecular or other non-intramolecular excitations; and obtaining a value related to the concentration of a component of the sample from the said section.
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