Invention Grant
US07663243B2 Semiconductor memory device comprising pseudo ground pad and related method
失效
半导体存储器件包括伪接地焊盘和相关方法
- Patent Title: Semiconductor memory device comprising pseudo ground pad and related method
- Patent Title (中): 半导体存储器件包括伪接地焊盘和相关方法
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Application No.: US11478600Application Date: 2006-07-03
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Publication No.: US07663243B2Publication Date: 2010-02-16
- Inventor: Jong-Mok Park
- Applicant: Jong-Mok Park
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2005-0086449 20050915
- Main IPC: H01L23/52
- IPC: H01L23/52

Abstract:
A semiconductor memory device comprising a pseudo ground voltage pad and a method of making the semiconductor device are disclosed. The semiconductor memory device comprises a plurality of pads that are respectively adjacent to one another in a first direction. The plurality of pads comprises a plurality of ground voltage pads and a plurality of data pads. The semiconductor memory device further comprises a first peripheral circuit ground line disposed adjacent to the pads and extending in the first direction, and an insulating layer formed on a portion of a first region of the semiconductor memory device comprising the plurality of pads and at least a portion of the first peripheral ground circuit line, wherein a region of the first peripheral circuit ground line is exposed to define a pseudo ground voltage pad, and the pseudo ground voltage pad is adjacent to one of the data pads.
Public/Granted literature
- US20070057377A1 Semiconductor memory device comprising pseudo ground pad and related method Public/Granted day:2007-03-15
Information query
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