Invention Grant
US07663384B2 Method and apparatus for measuring metallic area-specific resistance
有权
用于测量金属面积电阻率的方法和装置
- Patent Title: Method and apparatus for measuring metallic area-specific resistance
- Patent Title (中): 用于测量金属面积电阻率的方法和装置
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Application No.: US11892411Application Date: 2007-08-22
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Publication No.: US07663384B2Publication Date: 2010-02-16
- Inventor: Wei-Ja Shong
- Applicant: Wei-Ja Shong
- Applicant Address: TW Taoyuan
- Assignee: Atomic Energy Council
- Current Assignee: Atomic Energy Council
- Current Assignee Address: TW Taoyuan
- Agency: Jackson IPG PLLC
- Main IPC: G01R27/08
- IPC: G01R27/08
Abstract:
A simple method and apparatus for measuring the low area specific resistance of a metal plate, particularly in high temperature (
Public/Granted literature
- US20090051375A1 Method and apparatus for measuring metallic area-specific resistance Public/Granted day:2009-02-26
Information query
