Invention Grant
- Patent Title: Plural light source and camera to detect surface flaws
- Patent Title (中): 多个光源和相机检测表面缺陷
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Application No.: US11673054Application Date: 2007-02-09
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Publication No.: US07663745B2Publication Date: 2010-02-16
- Inventor: Kamran Uz Zaman , Stanley Pietrzykowski , Dante Pietrantoni , Kenneth Gottschalk , Richard Schichler
- Applicant: Kamran Uz Zaman , Stanley Pietrzykowski , Dante Pietrantoni , Kenneth Gottschalk , Richard Schichler
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agency: Pepper Hamilton LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method for detecting specular surface flaws on a coated substrate includes impinging visible non-integrated electromagnetic radiation from a first source onto the coated substrate, reflecting the visible non-integrated electromagnetic radiation off the coated substrate into a first photosensitive device, forming a recorded high frequency surface flaw image, and impinging visible coherent electromagnetic radiation from a second source onto a coated substrate at an oblique angle. The visible non-integrated electromagnetic radiation and the visible coherent electromagnetic radiation on the coated substrate are collocated but not combined on the substrate. The visible coherent electromagnetic radiation is reflected off the coated substrate onto a screen material to form a low frequency surface flaw image. The low frequency surface flaw image is recorded to form a recorded low frequency surface flaw image.
Public/Granted literature
- US20080192243A1 PLURAL LIGHT SOURCE AND CAMERA TO DETECT SURFACE FLAWS Public/Granted day:2008-08-14
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