Invention Grant
US07663757B2 Apparatus and method for obtaining a reflectance property indication of a sample
有权
用于获得样品的反射率特性指示的装置和方法
- Patent Title: Apparatus and method for obtaining a reflectance property indication of a sample
- Patent Title (中): 用于获得样品的反射率特性指示的装置和方法
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Application No.: US11527993Application Date: 2006-09-27
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Publication No.: US07663757B2Publication Date: 2010-02-16
- Inventor: Wei Li , Ross Chow , Jim Boyd Curtis , Xiaocai Joyce Chen
- Applicant: Wei Li , Ross Chow , Jim Boyd Curtis , Xiaocai Joyce Chen
- Applicant Address: CA Edmonton
- Assignee: Alberta Research Council Inc.
- Current Assignee: Alberta Research Council Inc.
- Current Assignee Address: CA Edmonton
- Agency: Rodman & Rodman
- Agent Terrence N. Kuharchuk
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A method for obtaining a reflectance property indication of a sample which includes making a reflectance measurement of the sample and correcting the reflectance measurement in order to obtain the reflectance property indication. The reflectance measurement represents an observed reflectance of the sample, the reflectance property indication represents a standardized reflectance of the sample, and correcting the reflectance measurement accounts for a difference between the standardized reflectance and the observed reflectance. An apparatus for making a reflectance measurement of a sample which includes a housing defining a viewing port, a temperature control mechanism for controlling the temperature within the interior of the housing, and an optical reflectometer contained within the interior of the housing. The reflectometer has a measurement direction and is movable within the housing so that the measurement direction can be selectively aligned with the viewing port.
Public/Granted literature
- US20080079943A1 Apparatus and method for obtaining a reflectance property indication of a sample Public/Granted day:2008-04-03
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