Invention Grant
- Patent Title: Measuring device and method to optically measure an object
- Patent Title (中): 用于光学测量物体的测量装置和方法
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Application No.: US11627124Application Date: 2007-01-25
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Publication No.: US07663764B2Publication Date: 2010-02-16
- Inventor: Christian Rembe
- Applicant: Christian Rembe
- Applicant Address: DE Waldbronn
- Assignee: Polytec GmbH
- Current Assignee: Polytec GmbH
- Current Assignee Address: DE Waldbronn
- Agency: Volpe and Koenig, P.C.
- Priority: EP06001676 20060127
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A measuring device for the optic measuring of an object 13a is provided, in particular for measuring a motion of the object. The device includes an interferometer 20 with a measuring beam exit 12, a reflection beam entry 14, an interfering beam exit 15, and a light source 1 for creating a light beam 8, an optic detector 16, which is arranged at the interfering beam exit 15 of the interferometer 20 such that a light beam exiting the interfering beam exit 15 impinges the detector and a signal processing unit 17 connected to the detector 16 being embodied such that they can measure measuring signals of the detector 16. The interferometer (20) is provided with a switched beam entry (18) and is embodied such that dependent on a switching signal connected to a switched beam entry (18) a light beam exits the measuring beam exit (12) essentially with a predetermined light intensity and at a predetermined angle, and that the signal processing unit (17) is provided with a switched beam exit, which is connected to the switched beam entry (18) of the interferometer, with the signal processing unit (17) controlling the interferometer such that a light beam exits the measuring beam exit (12) only during the measuring of measuring signals essentially with a predetermined light intensity and at a predetermined angle.
Public/Granted literature
- US20070177154A1 MEASURING DEVICE AND METHOD TO OPTICALLY MEASURE AN OBJECT Public/Granted day:2007-08-02
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