Invention Grant
US07663848B1 Magnetic memories utilizing a magnetic element having an engineered free layer
有权
利用具有工程自由层的磁性元件的磁存储器
- Patent Title: Magnetic memories utilizing a magnetic element having an engineered free layer
- Patent Title (中): 利用具有工程自由层的磁性元件的磁存储器
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Application No.: US11523872Application Date: 2006-09-20
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Publication No.: US07663848B1Publication Date: 2010-02-16
- Inventor: Yiming Huai , Zhitao Diao , Eugene Youjun Chen
- Applicant: Yiming Huai , Zhitao Diao , Eugene Youjun Chen
- Applicant Address: US CA Milpitas JP Tokyo
- Assignee: Grandis, Inc.,Renesas Technology Corp
- Current Assignee: Grandis, Inc.,Renesas Technology Corp
- Current Assignee Address: US CA Milpitas JP Tokyo
- Agency: Virtual Law Partners LLP
- Main IPC: G11B5/127
- IPC: G11B5/127

Abstract:
A method and system for providing a magnetic memory are described. The method and system include providing a plurality of magnetic storage cells. Each of the magnetic storage cells includes at least one magnetic element. The magnetic element(s) includes a pinned layer, a barrier layer that is a crystalline insulator and has a first crystalline orientation, and a free layer. The free layer includes a first ferromagnetic layer, a second ferromagnetic layer, and an intermediate layer between the first and second ferromagnetic layer. The barrier layer resides between the pinned and free layers. The first ferromagnetic layer resides between the barrier layer and the intermediate layer and is ferromagnetically coupled with the second ferromagnetic layer. The intermediate layer is configured such that the first ferromagnetic layer has the first crystalline orientation and the second ferromagnetic layer has a second crystalline orientation different from the first ferromagnetic layer. The magnetic element is configured to allow the free layer to be switched utilizing spin transfer when a write current is passed through the magnetic element.
Information query
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