Invention Grant
- Patent Title: Ferroelectric memory device and data read method in same
- Patent Title (中): 铁电存储器件和数据读取方法相同
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Application No.: US11511212Application Date: 2006-08-29
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Publication No.: US07663905B2Publication Date: 2010-02-16
- Inventor: Susumu Shuto
- Applicant: Susumu Shuto
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2006-061445 20060307
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
A ferroelectric memory device includes a memory cell, read circuit, temperature sensing circuit, and read controller. The memory cell includes a ferroelectric capacitor. The read circuit is configured to read data from the memory cell. The temperature sensing circuit is configured to sense the ambient temperature of the memory cell. The read controller is configured to receive a temperature sensing signal from the temperature sensing circuit, and inhibit a data read operation by the read circuit when the temperature sensed by the temperature sensing circuit is higher than a preset temperature.
Public/Granted literature
- US20070211512A1 Ferroelectric memory device Public/Granted day:2007-09-13
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