Invention Grant
US07663946B2 Semiconductor memory device having on-die-termination device and operation method thereof
有权
具有片上终端装置的半导体存储器件及其操作方法
- Patent Title: Semiconductor memory device having on-die-termination device and operation method thereof
- Patent Title (中): 具有片上终端装置的半导体存储器件及其操作方法
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Application No.: US12005671Application Date: 2007-12-28
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Publication No.: US07663946B2Publication Date: 2010-02-16
- Inventor: Kyung-Whan Kim
- Applicant: Kyung-Whan Kim
- Applicant Address: KR
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR
- Agency: Blakely, Sokoloff, Taylor & Zafman
- Priority: KR10-2007-0070052 20070712
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A semiconductor memory device is capable of stably securing an on-die-termination (ODT) latency in spite of PVT variations and various operating speeds. The semiconductor memory device includes a plurality of termination resistors connected to an output pad in series and parallel, a drive controller, a delay path, and a delay control signal generator. The drive controller activates/inactivates the plurality of termination resistors in response to a driving control signal. The delay path delays a termination command by a delay time corresponding to an on-die-termination (ODT) latency to output the driving control signal, wherein the termination command is converted into a delay locked loop (DLL) clock domain signal. The delay control signal generator controls a conversion point of the termination command into the DLL clock domain signal.
Public/Granted literature
- US20090016124A1 Semiconductor memory device having on-die-termination device and operation method thereof Public/Granted day:2009-01-15
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