Invention Grant
- Patent Title: Optical recording medium recording control method, recording control device and inspection method
- Patent Title (中): 光记录介质记录控制方法,记录控制装置及检查方法
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Application No.: US11064936Application Date: 2005-02-25
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Publication No.: US07663995B2Publication Date: 2010-02-16
- Inventor: Kiyoshi Horimai
- Applicant: Kiyoshi Horimai
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2004-054453 20040227
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
An evaluation pattern, for evaluating the extent of occurrence of thermal interference, is recorded with recording power being varied stepwise from a low recording power to a high recording power. This test-written evaluation pattern is played back, and levels of occurrence of thermal interference are quantified for each recording power level of the recording. Then, recording power is set to a value such that a quantified value therefor is smaller than a pre-specified slice level. For the slice level, a measured value of PI errors (correctable errors) for carrying out acceptable recording is found, and the slice level is determined by finding a variation amount that corresponds to this measured value of PI errors.
Public/Granted literature
- US20050190673A1 Optical recording medium recording control method, recording control device and inspection method Public/Granted day:2005-09-01
Information query
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