A method and an arrangement for an intelligent adaptive x-ray imaging system, in which the exposure conditions of the object to x-rays is dynamically controlled and optimized in real-time in order to provide the optimum diagnostic information. The arrangement splits the imaging beam into two separate fan beams that scan over the object in a single pass, where the first beam (scout) collects information from the object, that is analyzed to control the intensity or spectral quality or spatial distribution of the second beam (I-ImaS). The CMOS image sensors deployed in the arrangement are able to process detected information either on-chip or within a field programmable gate array, so as to compute a measure related to the diagnostic value of the information.