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US07665051B2 Method and device for classifying cells in a layout into a same environment and their use for checking the layout of an electronic circuit 失效
将布局中的单元格分类到相同环境中的方法和设备及其用于检查电子电路布局的用途

  • Patent Title: Method and device for classifying cells in a layout into a same environment and their use for checking the layout of an electronic circuit
  • Patent Title (中): 将布局中的单元格分类到相同环境中的方法和设备及其用于检查电子电路布局的用途
  • Application No.: US11832465
    Application Date: 2007-08-01
  • Publication No.: US07665051B2
    Publication Date: 2010-02-16
  • Inventor: Burkhard Ludwig , Uwe Mueller
  • Applicant: Burkhard Ludwig , Uwe Mueller
  • Applicant Address: DE Munich
  • Assignee: Qimonda AG
  • Current Assignee: Qimonda AG
  • Current Assignee Address: DE Munich
  • Agency: Slater & Matsil, L.L.P.
  • Priority: DE102006037162 20060801
  • Main IPC: G06F17/50
  • IPC: G06F17/50 ;  G06F9/45
Method and device for classifying cells in a layout into a same environment and their use for checking the layout of an electronic circuit
Abstract:
A method and a device can be used for checking the layout of an electronic circuit of a semiconductor component. For example, the method includes an automatic classification of cells in at least one layout into a cell database, and an automatic layout checker comparing the cell database to a layout to be checked.
Abstract(Chinese):

可以使用方法和装置来检查半导体部件的电子电路的布局。 例如，该方法包括将至少一个布局中的单元格自动分类为单元数据库，以及将单元数据库与要检查的布局进行比较的自动布局检查器。

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