Invention Grant
- Patent Title: Heat treatment apparatus and methods for thermally processing a substrate using a pressurized gaseous environment
- Patent Title (中): 热处理装置和使用加压气体环境热处理基板的方法
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Application No.: US11693827Application Date: 2007-03-30
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Publication No.: US07665917B2Publication Date: 2010-02-23
- Inventor: Brian Head
- Applicant: Brian Head
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Wood, Herron & Evans, LLP
- Main IPC: G03D5/00
- IPC: G03D5/00

Abstract:
Apparatus and methods for heating a substrate in a pressurized environment inside of a thermal processing system. The substrate is placed in a gaseous environment inside a processing chamber of the thermal processing system. The substrate is supported in the gaseous environment. The gas pressure inside the processing chamber is increased above atmospheric pressure, which increases the temperature of the gaseous environment. Heat is transferred from the pressurized gaseous environment to the substrate for thermally processing a layer on the substrate.
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