Invention Grant
- Patent Title: Semiconductor element, semiconductor device, and method of manufacturing the same
- Patent Title (中): 半导体元件,半导体器件及其制造方法
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Application No.: US11690461Application Date: 2007-03-23
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Publication No.: US07666726B2Publication Date: 2010-02-23
- Inventor: Sumio Utsunomiya , Hideto Ishiguro
- Applicant: Sumio Utsunomiya , Hideto Ishiguro
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2006-084932 20060327; JP2006-318109 20061127
- Main IPC: H01L21/84
- IPC: H01L21/84

Abstract:
A method of manufacturing a semiconductor element includes: (a) preparing a first substrate provided with a plurality of protruding sections formed on a surface of the first substrate and a second substrate provided with a semiconductor film formed on a surface of the second substrate; and (b) executing a heat treatment on the semiconductor film while the plurality of protruding sections and the semiconductor film are in contact with each other.
Public/Granted literature
- US20070224741A1 SEMICONDUCTOR ELEMENT, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2007-09-27
Information query
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