Invention Grant
- Patent Title: Deposition method for a transition-metal-containing dielectric
- Patent Title (中): 含过渡金属的电介质的沉积方法
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Application No.: US11655583Application Date: 2007-01-19
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Publication No.: US07666752B2Publication Date: 2010-02-23
- Inventor: Stephan Kudelka , Lars Oberbeck , Uwe Schroeder , Tim Boescke , Johannes Heitmann , Annette Saenger , Joerg Schumann , Elke Erben
- Applicant: Stephan Kudelka , Lars Oberbeck , Uwe Schroeder , Tim Boescke , Johannes Heitmann , Annette Saenger , Joerg Schumann , Elke Erben
- Applicant Address: DE Munich
- Assignee: Qimonda AG
- Current Assignee: Qimonda AG
- Current Assignee Address: DE Munich
- Agency: Fay Kaplun & Marcin, LLP
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
The present invention relates to a method for depositing a dielectric material comprising a transition metal compound. After providing a substrate, a first pre-cursor comprising a transition metal compound and a second pre-cursor predominantly comprising at least one of water vapour, ammonia and hydrazine are successively applied on the substrate for forming a first layer of transition metal containing material. In a next step the first pre-cursor and a third pre-cursor comprising at least one of ozone and oxygen are successively applied on the first layer for forming a second layer of the transition metal containing material.
Public/Granted literature
- US20080173919A1 Deposition method for a transition-metal-containing dielectric Public/Granted day:2008-07-24
Information query
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