Invention Grant
- Patent Title: Method for manufacturing SOI substrate
- Patent Title (中): 制造SOI衬底的方法
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Application No.: US12078211Application Date: 2008-03-28
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Publication No.: US07666757B2Publication Date: 2010-02-23
- Inventor: Hideto Ohnuma
- Applicant: Hideto Ohnuma
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-132085 20070517
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
An object is to provide a method for manufacturing an SOI substrate, by which defective bonding can be prevented. An embrittled layer is formed in a region of a semiconductor substrate at a predetermined depth; an insulating layer is formed over the semiconductor substrate; the outer edge of the semiconductor substrate is selectively etched on the insulating layer side to a region at a greater depth than the embrittled layer; and the semiconductor substrate and a substrate having an insulating surface are superposed on each other and bonded to each other with the insulating layer interposed therebetween. The semiconductor substrate is heated to be separated at the embrittled layer while a semiconductor layer is left remaining over the substrate having an insulating surface.
Public/Granted literature
- US20080286939A1 Method for manufacturing SOI substrate Public/Granted day:2008-11-20
Information query
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