Invention Grant
- Patent Title: Heat treatment apparatus and method of manufacturing a semiconductor device
- Patent Title (中): 热处理装置及半导体装置的制造方法
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Application No.: US11652094Application Date: 2007-01-11
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Publication No.: US07666772B2Publication Date: 2010-02-23
- Inventor: Koji Dairiki , Shunpei Yamazaki
- Applicant: Koji Dairiki , Shunpei Yamazaki
- Applicant Address: JP Atsugi-shi, Kanagawa-Ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-Ken
- Agency: Nixon Peabody, LLP
- Agent Jeffrey L. Costellia
- Priority: JP2000-370779 20001205
- Main IPC: H01L21/26
- IPC: H01L21/26 ; H01L21/425

Abstract:
A heat treatment apparatus which enables a heating process for a short time with high reproducibility in a manufacturing process of a MOS transistor manufactured using a semiconductor substrate, and a method of manufacturing a semiconductor device using the heat treatment apparatus are provided. The heat treatment apparatus of the present invention which enables the above heat treatment method is characterized by comprising: a light source; a power supply for turning the light source on and off in a pulse shape; a processing chamber in which the substrate can be irradiated with light from the light source; and a unit for supplying a coolant to the processing chamber and also increasing and decreasing the supply amount.
Public/Granted literature
- US20070117362A1 Heat treatment apparatus and method of manufacturing a semiconductor device Public/Granted day:2007-05-24
Information query
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