Invention Grant
- Patent Title: Methods of trench and contact formation in memory cells
- Patent Title (中): 记忆细胞中沟槽和接触形成的方法
-
Application No.: US12211603Application Date: 2008-09-16
-
Publication No.: US07666784B2Publication Date: 2010-02-23
- Inventor: Miao-Chih Hsu , Tzung-Ting Han , Ming-Shang Chen
- Applicant: Miao-Chih Hsu , Tzung-Ting Han , Ming-Shang Chen
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX International Co., Ltd.
- Current Assignee: MACRONIX International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: H01L21/4763
- IPC: H01L21/4763

Abstract:
Methods of contact formation and memory arrays formed using such methods, which methods include providing a substrate having a contacting area; forming a plurality of line-shape structures extending in a first direction; forming a hard mask spacer beside the line-shape structure; forming an insulating material layer above the hard mask spacer; forming a contiguous trench in the insulating material layer extending in a second direction different from the first direction and exposing the contacting area; and forming a conductive line in the trench to contact the contacting area.
Public/Granted literature
- US20090011594A1 Methods of Trench and Contact Formation in Memory Cells Public/Granted day:2009-01-08
Information query
IPC分类: