Invention Grant
- Patent Title: Method for determining a particle and sensor device therefor
- Patent Title (中): 确定颗粒的方法及其传感器装置
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Application No.: US12089341Application Date: 2005-10-05
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Publication No.: US07667205B2Publication Date: 2010-02-23
- Inventor: Rafael Ballabriga , Michael Campbell , Christer Frojdh , Henricus M. Heijne , Xavier Llopart , Hans-Erik Nilsson , Lukas Tlustos
- Applicant: Rafael Ballabriga , Michael Campbell , Christer Frojdh , Henricus M. Heijne , Xavier Llopart , Hans-Erik Nilsson , Lukas Tlustos
- Applicant Address: CH Geneva
- Assignee: Organisation Europeenne pour la Recherche Nucleaire
- Current Assignee: Organisation Europeenne pour la Recherche Nucleaire
- Current Assignee Address: CH Geneva
- Agency: Patzik, Frank & Samotny Ltd.
- International Application: PCT/EP2005/011645 WO 20051005
- International Announcement: WO2007/038974 WO 20070412
- Main IPC: H01L27/142
- IPC: H01L27/142 ; G01T1/29

Abstract:
A method for determining a particle impact on a sensor device comprising M sensing areas, each impact causing a variation of at least one physical magnitude of several sensing portions, said method comprising the steps of: determining an impact center sensing area, where the variation of the at least one physical magnitude is substantially maximal, allocating a result of a sum of the physical magnitude variations of a first set of N sensing areas, said set including the impact center area and other sensing areas neighboring said impact center sensing area, where N is at least 2 and is strict less than M.
Public/Granted literature
- US20080251730A1 Method for Determining a Particle and Sensor Device Therefor Public/Granted day:2008-10-16
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