Invention Grant
- Patent Title: Semiconductor integrated circuit switch matrix
- Patent Title (中): 半导体集成电路开关矩阵
-
Application No.: US11182026Application Date: 2005-07-15
-
Publication No.: US07667276B2Publication Date: 2010-02-23
- Inventor: Tadahiro Ohmi , Koji Kotani , Kazuyuki Maruo , Takahiro Yamaguchi
- Applicant: Tadahiro Ohmi , Koji Kotani , Kazuyuki Maruo , Takahiro Yamaguchi
- Applicant Address: JP Tokyo JP Miyagi
- Assignee: Advantest Corporation,National University Corporation Tohoku University
- Current Assignee: Advantest Corporation,National University Corporation Tohoku University
- Current Assignee Address: JP Tokyo JP Miyagi
- Agency: Osha • Liang LLP
- Priority: JP2004-210699 20040716
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119

Abstract:
There is provided a small-type semiconductor integrated circuit whose circuit area is small and whose wiring length is short. The semiconductor integrated circuit is constructed in a multi-layer structure and is provided with a first semiconductor layer, a first semiconductor layer transistor formed in the first semiconductor layer, a wiring layer which is deposited on the first semiconductor layer and in which metal wires are formed, a second semiconductor layer deposited on the wiring layer and a second semiconductor layer transistor formed in the second semiconductor layer. It is noted that insulation of a gate insulating film of the first semiconductor layer transistor is almost equal with that of a gate insulating film of the second semiconductor layer transistor and the gate insulating film of the second semiconductor layer transistor is formed by means of radical oxidation or radical nitridation.
Public/Granted literature
- US20060017101A1 Semiconductor integrated circuit and manufacturing method of the same Public/Granted day:2006-01-26
Information query
IPC分类: