Invention Grant
- Patent Title: Target tester interface
- Patent Title (中): 目标测试仪界面
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Application No.: US11669418Application Date: 2007-01-31
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Publication No.: US07667466B2Publication Date: 2010-02-23
- Inventor: Peter Jackson
- Applicant: Peter Jackson
- Applicant Address: US TX Angleton
- Assignee: Benchmark Electronics
- Current Assignee: Benchmark Electronics
- Current Assignee Address: US TX Angleton
- Agency: Merchant & Gould P.C.
- Main IPC: H01H31/02
- IPC: H01H31/02 ; A47K1/04 ; F16M13/00 ; A47B81/00

Abstract:
An electronics testing assembly includes a housing, a tester assembly, and an activation assembly. The housing is sized to retain the activation assembly and at least one electronics testing device. The tester enclosure is configured to house a plurality of tester connector interfaces that are mounted to a first connector plate. The activation assembly includes an actuator assembly and a plurality of activation connector interfaces mounted to a second connector plate. The actuator assembly is configured to move the second connector plate between a lowered vertical position and a raised vertical position within the housing while maintaining a fixed orientation of the tester enclosure relative to the housing. In the lowered vertical position the activation connector interfaces are spaced apart from the tester connector interfaces, and in the raised vertical position the activation connector interfaces are engaged with the tester connector interfaces to create an electrical connection.
Public/Granted literature
- US20080180110A1 TARGET TESTER INTERFACE Public/Granted day:2008-07-31
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