Invention Grant
US07667471B2 Contact pin probe card and electronic device test apparatus using same
失效
接触针探针卡和电子设备测试仪使用相同
- Patent Title: Contact pin probe card and electronic device test apparatus using same
- Patent Title (中): 接触针探针卡和电子设备测试仪使用相同
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Application No.: US10566463Application Date: 2004-12-14
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Publication No.: US07667471B2Publication Date: 2010-02-23
- Inventor: Fumio Kurotori , Takaji Ishikawa , Tadao Saito
- Applicant: Fumio Kurotori , Takaji Ishikawa , Tadao Saito
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- International Application: PCT/JP2004/018652 WO 20041214
- International Announcement: WO2006/064546 WO 20060622
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A contact pin (50) for contacting a terminal of a wafer and supplying a signal to that wafer is provided with a first conductive layer (51b) composed of a first conductive material having a relatively higher hardness than the oxide film formed on the terminal of the wafer, a second conductive layer (51c) composed of a second conductive material having a relatively lower hardness than the oxide film, and a base material (51a) with the first conductive layer (51b) and second conductive layer (51c) formed at the outside, the first conductive layer (51b) being formed so as to closely contact the outside of the second conductive layer (51c), the first conductive layer (51b) and second conductive layer (51c) both being exposed at the front end face (50a) of the contact pin (50).
Public/Granted literature
- US20080143366A1 Contact Pin Probe Card and Electronic Device Test Apparatus Using Same Public/Granted day:2008-06-19
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