Invention Grant
US07667545B2 Automatic calibration lock loop circuit and method having improved lock time
有权
自动校准锁环电路和方法具有改进的锁定时间
- Patent Title: Automatic calibration lock loop circuit and method having improved lock time
- Patent Title (中): 自动校准锁环电路和方法具有改进的锁定时间
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Application No.: US12042216Application Date: 2008-03-04
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Publication No.: US07667545B2Publication Date: 2010-02-23
- Inventor: David M. Schlueter , Michael C. Doll
- Applicant: David M. Schlueter , Michael C. Doll
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Vedder Price P.C.
- Main IPC: H03L7/08
- IPC: H03L7/08 ; H03L7/085 ; H03L7/093

Abstract:
A lock loop circuit (216) includes a precharge circuit (304), an oscillator circuit (306), and a calibration circuit (309). The calibration circuit includes at least one register (362). The precharge circuit provides a precharge signal (347). The oscillator circuit provides an output frequency signal (228) in response to a steering signal (334) that is based on the precharge signal. The calibration circuit, prior to the lock loop circuit entering a disabled mode of operation, determines a calibration value (368) for the precharge circuit based on the precharge signal and the steering signal. The calibration circuit stores the calibration value as a digital calibration value (370) in the register.
Public/Granted literature
- US20090224838A1 Automatic Calibration Lock Loop Circuit and Method Having Improved Lock Time Public/Granted day:2009-09-10
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