Invention Grant
- Patent Title: Quantizing circuits for semiconductor devices
- Patent Title (中): 半导体器件的量化电路
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Application No.: US11818999Application Date: 2007-06-15
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Publication No.: US07667632B2Publication Date: 2010-02-23
- Inventor: R. Jacob Baker
- Applicant: R. Jacob Baker
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
An electronic device that includes an internal data storage location coupled to an electrical conductor and a quantizing circuit coupled to the internal data storage location via the electrical conductor. In some embodiments, the quantizing circuit includes an analog-to-digital converter having an input and an output, where the input is coupled to the electrical conductor and a digital filter coupled to the output of the analog-to-digital converter.
Public/Granted literature
- US20080309534A1 Quantizing circuits for semiconductor devices Public/Granted day:2008-12-18
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