Invention Grant
- Patent Title: Optical characteristic measuring apparatus
- Patent Title (中): 光学特性测量仪器
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Application No.: US12284432Application Date: 2008-09-22
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Publication No.: US07667856B2Publication Date: 2010-02-23
- Inventor: Tomohiro Fukamizu , Yoshiyuki Nagashima , Katsutoshi Tsurutani , Shinji Shimizu
- Applicant: Tomohiro Fukamizu , Yoshiyuki Nagashima , Katsutoshi Tsurutani , Shinji Shimizu
- Applicant Address: JP Osaka
- Assignee: Konica Minolta Sensing, Inc.
- Current Assignee: Konica Minolta Sensing, Inc.
- Current Assignee Address: JP Osaka
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-250052 20070926
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01H1/00

Abstract:
An optical characteristic measuring apparatus of the invention is configured in such a manner that a specular reflection light component in reflection light from an object to be measured is received, and shake of the apparatus is detected based on the amount of the received light. The optical characteristic measuring apparatus having the above arrangement enables to precisely measure an optical characteristic of the object to be measured, without the need of providing a mechanical switch or a like device, and without depending on the shape of the object to be measured.
Public/Granted literature
- US20090079984A1 Optical characteristic measuring apparatus Public/Granted day:2009-03-26
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