Invention Grant
- Patent Title: Test signal generating apparatus for communications equipment and test signal generating method for communications equipment
- Patent Title (中): 用于通信设备的测试信号发生装置和通信设备的测试信号生成方法
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Application No.: US11579644Application Date: 2006-04-06
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Publication No.: US07668234B2Publication Date: 2010-02-23
- Inventor: Akihisa Kumaki , Ikuya Otani , Norihiro Akiyama
- Applicant: Akihisa Kumaki , Ikuya Otani , Norihiro Akiyama
- Applicant Address: JP Atsugi-Shi
- Assignee: Anritsu Corp.
- Current Assignee: Anritsu Corp.
- Current Assignee Address: JP Atsugi-Shi
- Agency: Frishauf, Holtz, Goodman & Chick, P.C.
- Priority: JP2005-173877 20050614
- International Application: PCT/JP2006/007355 WO 20060406
- International Announcement: WO2006/134713 WO 20061221
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
A test signal generating apparatus for communications equipment sequentially uses first and second sequence information which are stored in a sequence memory for storing the first sequence information including a reading order and read addresses of unit data including I and Q waveform data, and desired signal levels to be set to the unit data, and the second sequence information including frequency offsets. Consequently, the test signal generating apparatus provides frequency offsets at a plurality of steps every predetermined frequency intervals by using a predetermined carrier frequency as a reference, with respect to the I and Q waveform data at a digital stage up to digital-to-analog converters, and outputs a test signal in the frequency hopping system.
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