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US07668364B2 Inspection method and apparatus for partially drilled microvias 有权
部分钻孔微孔检查方法和装置

Inspection method and apparatus for partially drilled microvias
Abstract:
Inspection of partially drilled microvias by fluorescence based optical imaging techniques, selective coaxial illumination and multivariable off-axis illumination and the use of comparative image analysis and the transformation of back reflected radiation by means of an integrated fluorescing plate mounted to the surface of a CCD or EMCCD array.
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