Invention Grant
- Patent Title: Inspection method and apparatus for partially drilled microvias
- Patent Title (中): 部分钻孔微孔检查方法和装置
-
Application No.: US11411977Application Date: 2006-04-26
-
Publication No.: US07668364B2Publication Date: 2010-02-23
- Inventor: Todd E. Lizotte , Orest Ohar
- Applicant: Todd E. Lizotte , Orest Ohar
- Applicant Address: JP Kanagawa
- Assignee: Hitachi Via Mechanics, Ltd.
- Current Assignee: Hitachi Via Mechanics, Ltd.
- Current Assignee Address: JP Kanagawa
- Agency: Davis & Bujold, P.L.L.C.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Inspection of partially drilled microvias by fluorescence based optical imaging techniques, selective coaxial illumination and multivariable off-axis illumination and the use of comparative image analysis and the transformation of back reflected radiation by means of an integrated fluorescing plate mounted to the surface of a CCD or EMCCD array.
Public/Granted literature
- US20080144921A1 Inspection method and apparatus for partially drilled microvias Public/Granted day:2008-06-19
Information query