Invention Grant
- Patent Title: Levenberg-Marquardt outlier spike removal method
- Patent Title (中): Levenberg-Marquardt异常穗去除方法
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Application No.: US11316315Application Date: 2005-12-20
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Publication No.: US07668663B2Publication Date: 2010-02-23
- Inventor: Ronald T. Kurnik , Laurent Francioli , Rolf Knobel
- Applicant: Ronald T. Kurnik , Laurent Francioli , Rolf Knobel
- Applicant Address: US CA Pleasanton
- Assignee: Roche Molecular Systems, Inc.
- Current Assignee: Roche Molecular Systems, Inc.
- Current Assignee Address: US CA Pleasanton
- Agency: Townsend and Townsend and Crew LLP
- Agent Gerald T. Gray
- Main IPC: G01N33/48
- IPC: G01N33/48

Abstract:
Systems and methods for identifying and removing spikes in data sets representing PCR growth curves or other sigmoid type curves or growth curves. A double sigmoid function with parameters determined using a Levenberg-Marquardt regression algorithm is used to find an approximation to the curve, and a statistical test such as a z-test is then used to identify spikes by identifying data points in the data set that do not fit well with the approximation. The identified spike(s) are removed from the data set and/or replaced with interpolated data points determined by using data points surrounding the identified spike(s). In one aspect, a spline interpolation process such as a cubic spline interpolation process is used to find an approximation to the data set with the identified spike points removed. Interpolated values to replace the spike points are then calculated using the cubic spline interpolation approximation curve.
Public/Granted literature
- US20070148632A1 Levenberg-Marquardt outlier spike removal method Public/Granted day:2007-06-28
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