Invention Grant
- Patent Title: Method for the evaluation of measurement uncertainty, and a device and system thereof
- Patent Title (中): 测量不确定度评估方法及其装置及系统
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Application No.: US12025391Application Date: 2008-02-04
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Publication No.: US07668693B2Publication Date: 2010-02-23
- Inventor: Kazuo Yoshihiro , Tadashi Endo
- Applicant: Kazuo Yoshihiro , Tadashi Endo
- Applicant Address: SG Singapore
- Assignee: Calibration & Testing International Pte., Ltd.
- Current Assignee: Calibration & Testing International Pte., Ltd.
- Current Assignee Address: SG Singapore
- Agency: Woodard, Emhardt, Moriarty, McNett & Henry LLP
- Main IPC: G01F17/18
- IPC: G01F17/18 ; G01F23/00

Abstract:
A method for evaluating uncertainty associated with the value of a measurand derived from measurements of a device under test is disclosed. A mathematical model is provided wherein the measurand is expressed as a function of (i) at least one physically observable quantity, and (ii) the reference value of the physically observable quantity in a reference device. The reference value of the reference device and the value of the measurand of the device under test are measured. The value of the at least one physically observable quantity is also measured. At least one uncertainty value is determined as a function of the physically observable, wherein the mathematical model takes into account the at least one source of uncertainty and the reference value of the reference device.
Public/Granted literature
- US20080125982A1 METHOD FOR THE EVALUATION OF MEASUREMENT UNCERTAINTY, AND A DEVICE AND SYSTEM THEREOF Public/Granted day:2008-05-29
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