Invention Grant
- Patent Title: Apparatus and method for defect replacement
- Patent Title (中): 缺陷更换装置及方法
-
Application No.: US11442930Application Date: 2006-05-30
-
Publication No.: US07669091B2Publication Date: 2010-02-23
- Inventor: Ching-Wen Hsueh , Shih-Hsin Chen
- Applicant: Ching-Wen Hsueh , Shih-Hsin Chen
- Applicant Address: CN Taiwan
- Assignee: Mediatek Inc.
- Current Assignee: Mediatek Inc.
- Current Assignee Address: CN Taiwan
- Agency: Ladas and Parry LLP
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Apparatuses and methods for defect replacement when an optical storage medium is read are provided. When the defect management is LOW, a pick-up head retrieves a set of data from the optical storage medium; a defect detector detects whether there is a defect in the set; if yes, a processor determines whether a replacement for the defect is in the set; and if yes, an interface transmits the replacement from the set. When the defect management is CRD, a buffer temporarily stores data retrieved from the optical storage medium; a defect detector detects whether there is a set of defects in the data; if yes, a comparator compares a length of the set of defects with a defect threshold length; a pick-up head reads more data from the optical storage medium continuously until the buffer reaches a buffer threshold if the length is compared shorter than the defect threshold length; and the pick-up head reads a set of replacements for the set of defects directly if the length is compared longer than the defect threshold length.
Public/Granted literature
- US20070300132A1 Apparatus and method for defect replacement Public/Granted day:2007-12-27
Information query