Invention Grant
- Patent Title: Vapor phase growth apparatus
- Patent Title (中): 气相生长装置
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Application No.: US10589348Application Date: 2005-02-15
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Publication No.: US07670434B2Publication Date: 2010-03-02
- Inventor: Eiichi Shimizu , Nobuhito Makino , Manabu Kawabe
- Applicant: Eiichi Shimizu , Nobuhito Makino , Manabu Kawabe
- Applicant Address: JP Tokyo
- Assignee: Nippon Mining & Metals Co., Ltd.
- Current Assignee: Nippon Mining & Metals Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2004-049125 20040225
- International Application: PCT/JP2005/002225 WO 20050215
- International Announcement: WO2005/081298 WO 20050901
- Main IPC: H01L21/00
- IPC: H01L21/00 ; C23C14/00 ; C23C16/00

Abstract:
It is to provide a vapor phase growth apparatus which can perform vapor phase growth of a thin film having a good uniformity throughout a surface of a wafer. The vapor phase growth apparatus includes at least a sealable reactor, a wafer containing member (wafer holder) installed within the reactor and having a wafer mounting portion (pocket hole) on a surface thereof for holding a wafer, a gas supply member (gas inlet pipe) for supplying raw material gas towards the wafer, a heating member (heater) for heating the wafer, and a heat uniformizing member (susceptor) for holding the wafer containing member and uniformizing heat from the heating member, wherein raw material gas is supplied into the reactor in a high temperature environment while heating the wafer by using the heating member via the heat uniformizing member and the wafer containing member, to form a film grown on a surface of the wafer, and wherein a recess portion depressed in a dome shape is formed at a back side of the wafer containing member.
Public/Granted literature
- US20070163504A1 Vapor phase growth apparatus Public/Granted day:2007-07-19
Information query
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