Invention Grant
- Patent Title: Methods and apparatuses for electrochemical-mechanical polishing
- Patent Title (中): 电化学机械抛光的方法和装置
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Application No.: US11397419Application Date: 2006-04-03
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Publication No.: US07670466B2Publication Date: 2010-03-02
- Inventor: Whonchee Lee
- Applicant: Whonchee Lee
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: C25D21/00
- IPC: C25D21/00

Abstract:
Methods and apparatuses for removing material from a microfeature workpiece are disclosed. In one embodiment, the microfeature workpiece is contacted with a polishing surface of a polishing medium, and is placed in electrical communication with first and second electrodes, at least one of which is spaced apart from the workpiece. A polishing liquid is disposed between the polishing surface and the workpiece and at least one of the workpiece and the polishing surface is moved relative to the other. Material is removed from the microfeature workpiece and at least a portion of the polishing liquid is passed through at least one recess in the polishing surface so that a gap in the polishing liquid is located between the microfeature workpiece and the surface of the recess facing toward the microfeature workpiece.
Public/Granted literature
- US20060189139A1 Methods and apparatuses for electrochemical-mechanical polishing Public/Granted day:2006-08-24
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