Invention Grant
- Patent Title: Method of processing a semiconductor substrate by thermal activation of light elements
- Patent Title (中): 通过光元件的热激活来处理半导体衬底的方法
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Application No.: US12401152Application Date: 2009-03-10
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Publication No.: US07670966B2Publication Date: 2010-03-02
- Inventor: Sébastien Dubois , Nicolas Enjalbert , Rémi Monna
- Applicant: Sébastien Dubois , Nicolas Enjalbert , Rémi Monna
- Applicant Address: FR Paris
- Assignee: Commissariat a l'Energie Atomique
- Current Assignee: Commissariat a l'Energie Atomique
- Current Assignee Address: FR Paris
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0852217 20080403
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
Method of processing a substrate containing at least one semiconductor of the SiXAY type and comprising at least four separate types of light elements, comprising at least the following steps: carrying out a first anneal of the substrate at a temperature T1 corresponding to a thermal activation temperature for a first one of the four types of light elements, carrying out a second anneal of the substrate at a temperature T2 corresponding to a thermal activation temperature for a second one of the four types of light elements, carrying out a third anneal of the substrate at a temperature T3 corresponding to a thermal activation temperature for a third one of the four types of light elements, carrying out a fourth anneal of the substrate at a temperature T4 corresponding to a thermal activation temperature for a fourth one of the four types of light elements, each anneal comprising a holding at the temperature T1, T2, T3 or T4 and the temperatures T1, T2, T3 and T4 being such that T1>T2>T3>T4.
Public/Granted literature
- US20090253225A1 METHOD OF PROCESSING A SEMICONDUCTOR SUBSTRATE BY THERMAL ACTIVATION OF LIGHT ELEMENTS Public/Granted day:2009-10-08
Information query
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