Invention Grant
- Patent Title: Self calibrating irradiation system
- Patent Title (中): 自校准照射系统
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Application No.: US12107528Application Date: 2008-04-22
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Publication No.: US07671327B2Publication Date: 2010-03-02
- Inventor: Michael Clancy , Lewis Levine
- Applicant: Michael Clancy , Lewis Levine
- Applicant Address: US MA Wayland
- Assignee: Candela Corporation
- Current Assignee: Candela Corporation
- Current Assignee Address: US MA Wayland
- Agency: Proskauer Rose LLP
- Main IPC: G01D18/00
- IPC: G01D18/00
Abstract:
A self calibrating irradiation system is provided. The system includes sources for providing a calibration beam and a radiation beam, one or more detectors and a processor. A method of calibrating an irradiation system is also provided. The method includes measuring the energy of a calibration beam and periodically updating a transmission value of the laser system based on a calibration factor and the energy of the calibration beam.
Public/Granted literature
- US20090261239A1 Self Calibrating Irradiation System Public/Granted day:2009-10-22
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