Invention Grant
- Patent Title: Inductively coupled plasma mass spectrometer
- Patent Title (中): 电感耦合等离子体质谱仪
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Application No.: US11825702Application Date: 2007-07-09
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Publication No.: US07671329B2Publication Date: 2010-03-02
- Inventor: Kenichi Sakata , Noriyuki Yamada
- Applicant: Kenichi Sakata , Noriyuki Yamada
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agent Marc Bobys
- Priority: JP2006-219520 20060811
- Main IPC: H01J49/12
- IPC: H01J49/12
Abstract:
An inductively coupled plasma mass spectrometer comprises a control device 70 for collectively controlling each of the following factors: the amount of liquid drops in the aerosol that is to be supplied to a plasma torch 20, the flow rate of carrier gases 76A and 76B in this aerosol, the RF output of a high-frequency power source 80, and the distance Z between plasma torch 20 and sampling interface 15 and 16.
Public/Granted literature
- US20080035844A1 Inductively coupled plasma mass spectrometer Public/Granted day:2008-02-14
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