Invention Grant
- Patent Title: Method of mass analysis and mass spectrometer
- Patent Title (中): 质量分析方法和质谱仪
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Application No.: US11853982Application Date: 2007-09-12
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Publication No.: US07671343B2Publication Date: 2010-03-02
- Inventor: Takaya Satoh
- Applicant: Takaya Satoh
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2006-246311 20060912
- Main IPC: B01D59/44
- IPC: B01D59/44 ; G01T3/00

Abstract:
Mass analysis method and mass spectrometer in which the S/N of mass spectra does not deteriorate due to accumulation if an ionization method, such as MALDI, producing spectral intensities that are not uniform in time is employed. Every given number of collected mass spectra are accumulated and stored to produce primary accumulation mass spectra. After the measurements, some of the stored primary accumulation spectra are selected according to a given rule based on a time trace of the intensities of the primary accumulation mass spectra. The selected spectra are accumulated to produce a secondary accumulation mass spectrum.
Public/Granted literature
- US20080061226A1 Method of Mass Analysis and Mass Spectrometer Public/Granted day:2008-03-13
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