Invention Grant
- Patent Title: Cleaning method, apparatus and cleaning system
- Patent Title (中): 清洁方法,设备和清洁系统
-
Application No.: US11544931Application Date: 2006-10-10
-
Publication No.: US07671347B2Publication Date: 2010-03-02
- Inventor: Dirk Heinrich Ehm , Johannes Hubertus Josephina Moors , Bastiaan Theodoor Wolschrijn , Marcus Gerhardus Hendrikus Meijerink , Thomas Stein
- Applicant: Dirk Heinrich Ehm , Johannes Hubertus Josephina Moors , Bastiaan Theodoor Wolschrijn , Marcus Gerhardus Hendrikus Meijerink , Thomas Stein
- Applicant Address: NL Veldhoven DE Oberkochen
- Assignee: ASML Netherlands B.V.,Carl Zeiss SMT AG
- Current Assignee: ASML Netherlands B.V.,Carl Zeiss SMT AG
- Current Assignee Address: NL Veldhoven DE Oberkochen
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G21K5/00
- IPC: G21K5/00

Abstract:
A method to clean optical elements of an apparatus, the apparatus being configured to project a beam of radiation onto a target portion of a substrate, the apparatus comprising a plurality of optical elements arranged in sequence in the path of the radiation beam, wherein the cleaning method comprises: cleaning one or more second optical elements of the sequence, which receive one or more relatively low second radiation doses during operation of the apparatus, utilizing cumulatively shorter cleaning periods than one or more first optical elements of the sequence that receive one or more first radiation doses during operation of the apparatus, a second radiation dose being lower than each relatively high first radiation dose.
Public/Granted literature
- US20080083878A1 Cleaning method, apparatus and cleaning system Public/Granted day:2008-04-10
Information query