Invention Grant
- Patent Title: Technique for moderating stresses cause by a difference in thermal expansion coeffiecients between a substrate and an electronic component
- Patent Title (中): 用于调节应力的技术由基板和电子部件之间的热膨胀系数的差异引起
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Application No.: US11566885Application Date: 2006-12-05
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Publication No.: US07671477B2Publication Date: 2010-03-02
- Inventor: Hironobu Ikeda
- Applicant: Hironobu Ikeda
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro LLP
- Priority: JP2005-351285 20050512
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52

Abstract:
A device comprises a plurality of first electrodes which are arranged on a surface of a substrate at predetermined space, a component which has an elasticity and a longitudinal axis, a plurality of conductors which are applied to a surface of said component at predetermined space, and each of which are connected to a corresponding one of said first electrodes, and a plurality of second electrodes which are arranged on a surface of a electronic component at predetermined space, and each of which are connected to a corresponding one of said conductors.
Public/Granted literature
- US20070090528A1 DEVICE, AND MANUFACTURING METHOD FOR THE DEVICE Public/Granted day:2007-04-26
Information query
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