Invention Grant
- Patent Title: Vertical guided probe array providing sideways scrub motion
- Patent Title (中): 垂直导向探针阵列提供侧面擦洗运动
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Application No.: US11975743Application Date: 2007-10-19
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Publication No.: US07671610B2Publication Date: 2010-03-02
- Inventor: January Kister
- Applicant: January Kister
- Applicant Address: US CA Carlsbad
- Assignee: MicroProbe, Inc.
- Current Assignee: MicroProbe, Inc.
- Current Assignee Address: US CA Carlsbad
- Agent Deborah A. Peacock; Samantha A. Updegraff; Robert Lodenkamper
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
Improved probing of closely spaced contact pads is provided by an array of guided vertical probes that has a sideways scrub relative to the line of contact pads. With this orientation of scrub motion, the probes can be relatively thin along the contact line, and relatively thick perpendicular to the contact line. The thin dimension of the probes allows for probing closely spaced contact pads, while the thick dimension of the probes provides mechanical robustness and current carrying capacity. The probes have a predetermined curvature in a plane including the contact line, to help determine the amount of scrub motion during contact. In a preferred embodiment, an array of probes is provided for probing two closely spaced and parallel rows of contact pads, offset from each other by half the contact pad pitch.
Public/Granted literature
- US20090102495A1 Vertical guided probe array providing sideways scrub motion Public/Granted day:2009-04-23
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