Invention Grant
US07671638B2 Negative N-epi biasing sensing and high side gate driver output spurious turn-on prevention due to N-epi P-sub diode conduction during N-epi negative transient voltage 有权
负N型epi偏置感测和高侧栅极驱动器输出虚假开启预防由于N-epi P-sub二极管导通N-epi负瞬态电压

Negative N-epi biasing sensing and high side gate driver output spurious turn-on prevention due to N-epi P-sub diode conduction during N-epi negative transient voltage
Abstract:
A high-side driver in a driver circuit for driving a half-bridge stage having high- and low-side power switching devices series connected at a switched node, the high-side driver driving the high-side power switching device. The high-side driver including first and second complementary switched MOSFET series connected at a high-side node, driving the high-side power switching device, one of the MOSFETs having a parasitic bipolar transistor formed between the substrate, an N+ epitaxial region connected to the high-side driver supply voltage and the switched node, with the parasitic transistor having a base electrode formed by the N+ epitaxial region, an emitter electrode formed by the substrate and a collector electrode formed by the switched node, such that if a transient voltage that is negative with respect to the substrate is present at the high-side driver supply voltage, the parasitic transistor will conduct a short circuit current between the switched node and the substrate; a first circuit for controlling the conduction of the first and second MOSFETs to switch the high-side switching device ON and OFF; a diffusion in the N+ epitaxial region in which a terminal connected to the switched node is provided by the diffusion forming the collector of the parasitic transistor; and a second circuit coupled to the diffusion for sensing the high-side driver supply voltage at the epitaxial region and providing a signal to the first circuit to prevent turn-ON of the high-side power switching device.
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