Invention Grant
US07671651B2 Duty cycle correction circuit of delay locked loop and delay locked loop having the duty cycle correction circuit
有权
具有占空比校正电路的延迟锁定环和延迟锁定环的占空比校正电路
- Patent Title: Duty cycle correction circuit of delay locked loop and delay locked loop having the duty cycle correction circuit
- Patent Title (中): 具有占空比校正电路的延迟锁定环和延迟锁定环的占空比校正电路
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Application No.: US11512155Application Date: 2006-08-30
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Publication No.: US07671651B2Publication Date: 2010-03-02
- Inventor: Chan-kyung Kim
- Applicant: Chan-kyung Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR2003-15863 20030313
- Main IPC: H03L7/00
- IPC: H03L7/00

Abstract:
A duty cycle correction circuit and a delay locked loop (DLL) including the duty cycle correction circuit, are capable of controlling their operation in order to correctly analyze the cause of generation of a duty cycle error when the duty cycle error is generated in the DLL. The duty cycle correction circuit selectively outputs to a DLL core duty cycle offset information for controlling a duty cycle of an internal clock signal synchronized to an external clock signal under the control of a switching control signal. The DLL corrects the duty cycle of a reference clock signal according to the duty cycle offset information, thereby outputting a reference clock signal having a 50% duty cycle.
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