Invention Grant
US07671908B2 Offset correction during correlated double sampling in CMOS image sensor 失效
CMOS图像传感器相关双采样期间的偏移校正

  • Patent Title: Offset correction during correlated double sampling in CMOS image sensor
  • Patent Title (中): CMOS图像传感器相关双采样期间的偏移校正
  • Application No.: US11595612
    Application Date: 2006-11-10
  • Publication No.: US07671908B2
    Publication Date: 2010-03-02
  • Inventor: Kwang-Hyun Lee
  • Applicant: Kwang-Hyun Lee
  • Applicant Address: KR Suwon-si
  • Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee: Samsung Electronics Co., Ltd.
  • Current Assignee Address: KR Suwon-si
  • Agent Monica H. Choi
  • Priority: KR10-2006-0010870 20060203
  • Main IPC: H04N5/217
  • IPC: H04N5/217
Offset correction during correlated double sampling in CMOS image sensor
Abstract:
For correlated double sampling in an image sensor, a comparator receives and compares a reset signal and a sensing signal from a pixel of the image sensor. Also, a controller adjusts a voltage at a controlled input of the comparator to compensate for offset of the comparator from feed-back of an output of the comparator. The controller includes at least one charging current source and at least one discharging current source that are controlled to adjust such a voltage.
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