Invention Grant
US07671908B2 Offset correction during correlated double sampling in CMOS image sensor
失效
CMOS图像传感器相关双采样期间的偏移校正
- Patent Title: Offset correction during correlated double sampling in CMOS image sensor
- Patent Title (中): CMOS图像传感器相关双采样期间的偏移校正
-
Application No.: US11595612Application Date: 2006-11-10
-
Publication No.: US07671908B2Publication Date: 2010-03-02
- Inventor: Kwang-Hyun Lee
- Applicant: Kwang-Hyun Lee
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agent Monica H. Choi
- Priority: KR10-2006-0010870 20060203
- Main IPC: H04N5/217
- IPC: H04N5/217

Abstract:
For correlated double sampling in an image sensor, a comparator receives and compares a reset signal and a sensing signal from a pixel of the image sensor. Also, a controller adjusts a voltage at a controlled input of the comparator to compensate for offset of the comparator from feed-back of an output of the comparator. The controller includes at least one charging current source and at least one discharging current source that are controlled to adjust such a voltage.
Public/Granted literature
- US20070182838A1 Offset correction during correlated double sampling in CMOS image sensor Public/Granted day:2007-08-09
Information query