Invention Grant
- Patent Title: Measurement system and scanning device for the photoelectric measurement of a measurement object pixel by pixel
- Patent Title (中): 用于测量对象的测量系统和扫描装置逐像素地测量
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Application No.: US11666365Application Date: 2005-10-28
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Publication No.: US07671992B2Publication Date: 2010-03-02
- Inventor: Peter Ehbets , Adrian Kohlbrenner , Beat Frick
- Applicant: Peter Ehbets , Adrian Kohlbrenner , Beat Frick
- Applicant Address: CH Regensdorf
- Assignee: X-Rite Europe GmbH
- Current Assignee: X-Rite Europe GmbH
- Current Assignee Address: CH Regensdorf
- Agency: McCarter & English, LLP
- International Application: PCT/EP2005/011592 WO 20051028
- International Announcement: WO2006/045621 WO 20060504
- Main IPC: G01J3/46
- IPC: G01J3/46 ; G01N21/25

Abstract:
The measuring device comprises a lighting system, a photoelectric receiver unit and optical means. The lighting system applies light to image elements disposed in strip-shaped lighting regions (15) at a standardized angle of incidence range. The photoelectric receiver unit comprises several photoelectric line sensors (21) disposed parallel at a distance apart which are sensitized to different wavelength ranges by color filters (22) connected upstream. The optical means comprise linear optical arrays (31) which pick up the measurement light reflected by the image elements at a standardized range of angle of reflection and direct it to one of the respective line sensors (21). By means of optical screening and other structural features, cross-talk effects between adjacent image elements are largely reduced.
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